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Learn XPSCollecting chemical information from the top 1–10nm of materials ranging from metals to polymers to organic thin films. |
Elements TableExplore our information-packed Knowledge Base of elemental properties and XPS analysis. |
MAGCIS Dual Ion BeamDual ion source for monatomic and gas cluster depth profiling and sample cleaning. |
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XPS InstrumentationLearn how our line of XPS systems fits your application requirements. |
XPS FeaturesDiscover what features are available to solve your surface analysis problems. |
XPS ApplicationsTo understand the chemical composition of surfaces and thin films, use XPS to analyze from 3 to 300 atomic layers. |
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